Contents

1. Crystal systems

2. Bravais lattices and Miller indices 

3. Point Group 

4. space groups and systematic absences 

5. Structure Vs lattices 

6. Optical diffraction and the Laue and Bragg experiments

7. The Ewald construction, Powder diffraction techniques 

8. Reciprocal lattices and Diffraction

9. Mathematical definition of reciprocal lattices and geometrical relationships to direct (Bravais)-lattices 

10. Role of reciprocal lattice in diffraction-the condition for constructive interference 

11. Structural factors, Integrated intensities and the phase problem

12. Patterson technique and direct methods

13. Systematic absences and symmetry 

14. Structure refinement, least squares 

15. Debye-Waller factors Data collection, unit cell and symmetry, Intensities, Data reduction,

16. Structure solutions,  Finishing Touches 

Recommended Books:

1. X-ray structure determination: A Practical Guide, by George H. Stout and Lyle H. Jensen, (1989).
2. An Introduction to X-ray Crystallography,  by Michael M. Woolfson, Cambridge University Press, (1997).
3. Elements of X-ray Diffraction, by B.D. Cullity and S.R. Stock, Prentice Hall (3rd Edition), (2000).

ASSESSMENT CRITERIA

• Sessional: 20 (Presentation / Assignment 10, Attendance 05, Quiz 05)
• Mid-Term Exam: 30
• Final-Term Exam: 50

Time of Class Meeting

Monday and Tuesday       9:30 am to 11:00 am

Key Dates

Commencement of Classes                                                   March 02, 2020

Mid Term Examination                                                            April 27 to May 04, 2020

Final Term Examination                                                          June 22-26, 2020

Declaration of Result                                                              July 03, 2020